Further high-end nanoanalytical instruments are available at LENA, including:
- Focused Ga Ion Beam - Scanning Electron Microscope (FIB-SEM)
- High-Resolution Transmission Electron Microscope (HR-TEM)
- Quantum Design Magnetic Property Measurement System (MPMS)
- Josephson-Cantilever-Based THz Microscope (THz-M)
