Eike Trumann presented his current research on radiation effects in SRAM-based FPGAs at EuroSimE 2026 in Warsaw. The work focused on Single Event Transients (SETs), which are relevant for the reliable use of FPGAs in radiation-affected environments.

Building on earlier studies on Single Event Upsets (SEUs), multiple Artix-7-35T FPGAs were exposed in parallel to 2.45 MeV neutron radiation. Two specially developed detection circuits were used to capture SETs. The results were obtained via the devices’ readback mechanism, eliminating the need for additional external detection hardware.

The findings provide a basis for SET fault models and thus support the evaluation of mitigation techniques as well as the assessment of error probabilities in implemented circuits. At the same time, the study shows that, compared to SEUs, SETs play only a minor role in the investigated 28 nm technology under neutron irradiation.