Outstanding Micrograph

Outstanding Micrograph

Outstanding Micrograph in MC2015 Best Image Contest "Art in Science"

During the microscopy conference 2015 in Göttingen the image "Light emitting region of a contacted core-shell LED inside an ensemble visualized by EBIC and SE imaging" was awarded with the third prize of all submissions.

Color overlay of the SE and EBIC image of an ensemble of 3D-LEDs at a tilt of 25° and a viewfield of 19.5 µm, contacted by a probe tip. J. Ledig, TU-Braunschweig

Figure 1: Color overlay of the SE and EBIC image of an ensemble of 3D-LEDs at a tilt of 25° and a viewfield of 19.5 µm, contacted by a probe tip. J. Ledig, TU-Braunschweig

Publication:

J. Ledig, X. Wang, S. Fündling, H. Schuhmann, M. Seibt, U. Jahn, H.-H. Wehmann, A. Waag:
Characterization of the internal properties of InGaN/GaN core-shell LEDs
Phys. Status Solidi (a).

Contact:

Johannes Ledig
Institute for Semiconductor Technology
Laboratory for Emerging Nanometrology

Technische Universität Braunschweig
Hans-Sommer-Straße 66
38106 Braunschweig

Phone: (+49) 531 391 3780
Email: a.waag@tu-braunschweig.de
www.tu-braunschweig.de/iht